A. von Bohlen
M. L. de Carvalho
J. H. Sanchez
R. van Grieken
M. C. Vazquez
M. A. Zaitz
The 17th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2017)
will be held in Brescia, Italy, from September 19 to 22, 2017. Flyer
The aim of TXRF 2017 is to bring together experts and users of TXRF technique to present and discuss recent advances, research results
and perspectives in different fields of applications, such as environmental and food analysis, forensic science, biology, semiconductor etc.
As the previous editions, TXRF 2017 will bring together scientists, end-users and instrument manufacturers,
being an excellent platform for networking and knowledge exchange.